IEEE Technical Applications Conference

IEEE Technical Applications Conference

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ETAP CONTROLLER The P1 149.4 test controller, called Extended Test Access Port (ETAP) since it extends the ... The ETAP controller consists of the Test Bus Interface Circuit described above, a test controller, and an instruction register.

Title:IEEE Technical Applications Conference
Author: Institute of Electrical and Electronics Engineers. Oregon Section, Institute of Electrical and Electronics Engineers. Seattle Section, Electronic Representatives Association (U.S.). Cascade Chapter, Electronics Manufacturers Association
Publisher:Institute of Electrical & Electronics Engineers(IEEE) - 1996-10

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